Tohoku University. Research Profiles

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Development of nanometer-scale surface vibrational spectroscopy and its application to actual devices

update:2018-12-18
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In recent years, limitations of downscaling in silicon based device technologies have come to be well recognized, and alternatives based on new operation principles and/or novel materials are being extensively explored. It is also well recognized that developments of such alternatives have to be started from a few of tens nanometer scale in device sizes. Hence evaluations of materials with corresponding spatial resolution are required. Our research group utilized scanning tunneling microscopy as a tool to elucidate the photo-electronic properties of the materials in atomic scale. This study intends to develop a new vibrational spectroscopic method with the nanometer-scale resolution and to apply this method to actual device evaluations. We hope to conduct collaborative research with a willing company for a practical application of this technology in industry.

Researchers

Research Institute of Electrical Communication

UEHARA, Yoichi , Professor
Doctor of Engineering

Keywords

Related Information

S. Katano, M. Hotsuki, Y. Uehara, J. Phys. Chem. C 120 (2016) 28575.
Y. Uehara, M. Kuwahara, S. Katano, Solid State Commun. 177 (2014) 29.
S. Katano, Y. Uehara, Oyobutsuri 80 (2011) 960.

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