X-Ray Phase Imaging for High-Sensitive Non-Destructive Testing
update：2020-06-16
Features
Conventional X-ray imaging methods that rely on X-ray attenuation cannot generate clear contrast in the observation of low-density materials such as polymers consisting of low-Z elements. However, the sensitivity to the materials can be improved drastically by X-ray phase imaging that detects X-ray refraction caused by the materials. X-ray Talbot or Talbot-Lau interferometry consisting of X-ray transmission gratings is now constructed in laboratories for X-ray phase imaging. X-ray phase tomography is also realized, enabling high-sensitive three-dimensional observation.X-ray phase imaging can be utilized for X-ray non-destructive testing of industrial products and baggage that cannot be checked conventionally.
Targeted Application(s)/Industry
We aim at appending a phase-contrast mode to micro-CT apparatuses and developing screening apparatuses in production lines.Researchers
Institute of Multidisciplinary Research for Advanced Materials
MOMOSE Atsushi
, Professor
Dr.
Keywords
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