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High-speed X-ray phase tomography with a millisecond-order temporal resolution

update：2020-06-16
 
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We successfully realized millisecond-order X-ray phase tomography using a fringe-scanning method in grating-based X-ray interferometry. We obtained phase tomograms with a measurement time of 4.43 ms using a white synchrotron X-ray beam. The use of a fringe-scanning method enables us to achieve not only a higher spatial resolution but also a higher signal-to-noise ratio than that attained by the Fourier transform method. In addition, our approach can be applied to realize four-dimensional or high-throughput X-ray tomography for samples that can be rotated at a high speed.

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Institute of Multidisciplinary Research for Advanced Materials (IMRAM)

YASHIRO Wataru , Professor
Doctor of Engineering

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