High-speed X-ray phase tomography with a millisecond-order temporal resolution

Features and Uniqueness
  • We successfully realized millisecond-order X-ray phase tomography using a fringe-scanning method in grating-based X-ray interferometry. We obtained phase tomograms with a measurement time of 4.43 ms using a white synchrotron X-ray beam. The use of a fringe-scanning method enables us to achieve not only a higher spatial resolution but also a higher signal-to-noise ratio than that attained by the Fourier transform method. In addition, our approach can be applied to realize four-dimensional or high-throughput X-ray tomography for samples that can be rotated at a high speed.


International Center for Synchrotron Radiation Innovation Smart

Wataru Yashiro, Professor
Doctor of Engineering