Tohoku University. Research Profiles


Development of nanometer-scale surface vibrational spectroscopy and its application to actual devices

In recent years, limitations of downscaling in silicon based device technologies have come to be well recognized, and alternatives based on new operation principles and/or novel materials are being extensively explored. It is also well recognized that developments of such alternatives have to be started from a few of tens nanometer scale in device sizes. Hence evaluations of materials with corresponding spatial resolution are required. Our research group utilized scanning tunneling microscopy as a tool to elucidate the photo-electronic properties of the materials in atomic scale. This study intends to develop a new vibrational spectroscopic method with the nanometer-scale resolution and to apply this method to actual device evaluations. We hope to conduct collaborative research with a willing company for a practical application of this technology in industry.


Research Institute of Electrical Communication

UEHARA Yoichi , Professor
Doctor of Engineering


Related Information

S. Katano, M. Hotsuki, Y. Uehara, J. Phys. Chem. C 120 (2016) 28575.
Y. Uehara, M. Kuwahara, S. Katano, Solid State Commun. 177 (2014) 29.
S. Katano, Y. Uehara, Oyobutsuri 80 (2011) 960.